Digital Electromagnetic Tomography Instrument
DEMT-8: Dual-mode instrument — tomography mode and metal flaw-detection mode.
Built on an FPGA digital core, the DEMT-8 supports both conductivity/permeability tomography and metal flaw detection, with real-time imaging at up to 400 fps.
Overview
One hardware platform · two operating modes
The DEMT-8's dual-mode architecture lets one device cover two distinct application classes. In tomography mode it reconstructs the distribution of conductive / permeable media inside a circular cross-section with 1% resolution (32×32 pixel grid). In metal flaw-detection mode the minimum detectable defect is 2 × 0.1 × 0.1 mm. Frequency coverage is 1 kHz - 200 kHz (standard) or 0.1 Hz - 500 kHz (wideband); programmable 3-stage front-end amplification keeps weak signals stable and extractable.
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Tomography + flaw detection
A single hardware platform covers both cross-sectional imaging and internal metal-defect detection — addressing research and industrial inspection needs.
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High real-time imaging rate
Up to 400 fps real-time imaging — captures the transients of fast-changing processes such as hot rolling and metallurgy.
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High-sensitivity signal chain
Programmable 3-stage front-end amplification (1×-8×); system SNR 60-90 dB; weak defects remain stable and extractable.
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Programmable measurement sequence
8 channels with arbitrary combinations and ordering — flexible excitation/measurement schemes for different experimental tasks.
Specifications
Measurement frequency
1 kHz - 200 kHz (standard); 0.1 Hz - 500 kHz (wideband).
System SNR
60 - 90 dB in tomography mode; ≥ 60 dB in flaw-detection mode.
Channels
8 channels — arbitrary combinations and measurement order, fully programmable.
Front-end amplification
Programmable 3-stage amplification at 1× to 8×.
Real-time imaging rate
Up to 400 fps (depending on electrode count and algorithm configuration).
Spatial resolution
1% of the circular cross-sectional area (32×32 pixel reconstruction).
Minimum detectable defect
2 × 0.1 × 0.1 mm (typical value in flaw-detection mode).
Operating temperature
Up to 300 ℃ medium temperature (higher available on request).
Gallery
Companion Software
Imaging / reconstruction software that pairs with this instrument
